Professor Doris Estelle Long (center), director of the Center for Intellectual Property Law, welcomed experts for a roundtable discussion looking at the judicial criticism of the methodologies used by patent damage experts in litigation cases, such as Apple v. Motorola and Brandeis University v. Keebler. Guests for the April 22, 2013, program included (from left) Paul Vickrey of Niro, Haller & Niro; Keith Parr of Locke Lord LLP; Kenneth Neumann, director of Litigation Services for RGL Forensics; and Chief Judge James F. Holderman of the United States District Court for the Northern District of Illinois.
Patent Damages
| April 26, 2013
